Faculty
Dr. Mridula Singh is tenure-track faculty at CISPA Helmholtz Center for Information Security in Saarbruecken, Germany. She is interested in Wireless and System Security, focusing strongly on autonomous cyber-physical systems. Her interest in designing physical layer Message Time of Arrival Codes establishes the foundation of secure proximity-based access control and positioning systems. This work has been instrumental in enabling secure passive keyless entry and start systems of various car models. She is currently exploring the possibility of designing secure LiDAR sensors, LEO positioning, and scalable positioning systems. She co-founded Trishulam while pursuing her master's degree. She worked as a research engineer at Xerox Research Center India, where she was involved in smart transportation and healthcare projects. She received her master's degree in computer science from IIIT-Delhi, India, and her Ph.D in Computer Science from ETH Zurich, Switzerland.
International Conference on Machine Learning workshop(ICML-W)
Prune to Protect: Faster Training and Enhanced Privacy by Dynamic Data Pruning
ACM Cyber-Physical System Security Workshop (CPSS)
FEVA-ICS: Benchmarking Adversarial Robustness of Machine Learning-based Intrusion Detection Systems in Industrial Control Systems
Usenix Security Symposium (USENIX-Security)
LEO-Range: Physical Layer Design for Secure Ranging with Low Earth Orbiting Satellites
Design, Automation & Test in Europe Conference (DATE)
Cybersecurity Challenges of Autonomous Systems
Conference on Wireless Network Security (WiSec)
International Conference on COMmunication Systems & NETworkS (COMSNETS)
Invited Paper: Challenges and Opportunities in Enabling Secure 5G Positioning
Network and Distributed System Security Symposium (NDSS)
ACM Conference on Security and Privacy in Wireless and Mobile Networks (ACM WiSec)
Here, there, and everywhere
ACM Conference on Security and Privacy in Wireless and Mobile Networks (ACM WiSec)
Security analysis of IEEE 802.15.4z/HRP UWB time-of-flight distance measurement